{"id":"cfb920cd-68db-41ae-864e-5a2ec68ee9c1","companyId":"3d798d2e-a115-4006-b0cc-4d77a1f4b66a","modelName":"SuaKIT","slug":"suakit","description":"SuaKIT was a deep learning machine vision inspection software library for automated defect detection in manufacturing. It supported segmentation, classification, and detection tasks across display, solar, PCB, film, and semiconductor production lines, using GPU-accelerated deep learning to replace human visual inspection.","formFactor":"other","industryVertical":null,"environment":null,"maturityStage":"commercial","lifecycleState":"active","supersededByModelId":null,"specs":{},"manufacturerSerial":null,"reviewStatus":"reviewed","sources":[{"url":"https://web.archive.org/web/2019/http://www.sualab.com/product/suakit","label":"SuaKIT - Deep Learning Machine Vision Software","title":"SuaKIT - Deep Learning Machine Vision Software","mediaType":"article","sourceName":"SUALAB"},{"url":"https://www.imveurope.com/press-releases/suakit-v23","title":"SuaKit v2.3","sourceName":"Imaging and Machine Vision Europe"}],"aliases":[],"collisionRisk":"low","reviewNote":null,"manufacturerTermForTeleop":null,"keyFacts":[{"label":"Form Factor","value":"other"},{"label":"Maturity","value":"commercial"},{"label":"Deep-learning inspection software","value":"Imaging and Machine Vision Europe says SuaKIT, from SUALAB, is deep-learning machine-vision software for atypical and irregular defects that rule-based vision misses, used for surface inspection in automotive, electronics, semiconductor, display, solar, packaging, and food and beverage lines, and that trained models can be exported as a C# or C++ API ([IMVE](https://www.imveurope.com/press-releases/suakit-v23))."},{"label":"SuaKIT 2.3 functions","value":"The same note says SUALAB released SuaKIT 1.0 in June 2017 and version 2.3 on September 2, enhancing Label Noise Detection and One Class Learning, and that 2.3 also adds Multi Project management of up to five projects, a Task Manager that allocates GPU resources, and Image Tag memos. It says the release would be shown at 2019 events including PPMA in Birmingham and CRAV.ai in San Jose ([IMVE](https://www.imveurope.com/press-releases/suakit-v23))."}],"createdAt":"2026-08-01T21:06:23.641Z","updatedAt":"2026-10-03T18:01:06.186Z","unitsInFieldClaimed":null,"unitsInFieldVerified":null,"unitsManufacturedClaimed":null,"unitsManufacturedVerified":null,"unitsAsOf":null,"unitsSource":null,"salesModel":null,"priceUndisclosedSince":null,"autonomyClass":null,"autonomyStatement":null,"autonomyStatementSource":null,"demoForensics":null,"exportControlClass":null,"minCommitment":null,"warrantyTerms":null,"serviceModel":null,"productionRateClaimed":null,"productionRateEvidenced":null,"teleopRatioDisclosed":null,"interventionRateDisclosed":null,"jsonLd":{"@context":"https://schema.org","@type":"Product","@id":"https://registry.deploy.report/models/suakit","url":"https://registry.deploy.report/models/suakit","name":"SuaKIT","description":"SuaKIT was a deep learning machine vision inspection software library for automated defect detection in manufacturing. It supported segmentation, classification, and detection tasks across display, solar, PCB, film, and semiconductor production lines, using GPU-accelerated deep learning to replace human visual inspection.","identifier":"cfb920cd-68db-41ae-864e-5a2ec68ee9c1","category":"other","publisher":{"@id":"https://deploy.report/#organization"}},"framework_metadata":{"framework_schema_version":"0.1.0","verification_status":"verified","maturity_stage":"commercial","lifecycle_state":"active","architectural_position":{"cohort":"other","sub_cohorts":[]},"within_cohort_verified_vs_claimed_pair":null,"cap_flags":[],"verification_depth":{"sources_count":2,"primary_source_types":[]}}}